Reading, PA, July 30, 2010, Silicon Cert Laboratories has now been added to the Independent Distributors of Electronics Association’s (IDEA) list of companies that provides screening and testing services. IDEA is the leading online resource for independent distributors to find relevant quality information and to participate in advancing industry ethics, ensuring customer satisfaction, establishing standards and promoting education. For more information on IDEA, visit their website at www.Idofea.org.

Reading PA, May 6, 2010, Mid-Atlantic IMAPS Microelectronics Conference Silicon Cert Laboratories (SCL) will be exhibiting at IMAP’s Mid-Atlantic Microelectronics Conference being held in Atlantic City, NJ on June 17-18, 2010. This conference, co-located with the IMAPS Portable/Wireless Workshop, combines the Empire, Metropolitan, Garden State, Keystone and Chesapeake Chapters. Silicon Cert Laboratories’ Anne Poncheri will be presenting a workshop on ”Counterfeit Detection in the Electronics Industry” during the conference.

Reading, PA, March 8, 2010, Anne Poncheri will be presenting a talk on “Counterfeit Detection in the Electronics Industry” at the Keystone Chapter of IMAPS (International Microelectronics And Packaging) March 25th in Allentown, PA. Ms. Poncheri is the quality manager at Silicon Cert Laboratories. Her presentation will address the sources of how counterfeit electronic components enter the supply chain, the severity of the problem and the implementation of risk mitigation policies.

Reading, PA, February 4, 2010, Anne Poncheri, quality manager for Silicon Cert Laboratories (SCL) has become an active member of the SAE Aerospace G19 Counterfeit Electronic Components Committee. The committee is chartered to address all aspects of preventing, detecting, responding to and counteracting the threat of counterfeit electronic components. Other companies represented on the G19 committee include the Boeing Company, BAE Systems, Raytheon and Arrow Electronics.

Reading, PA,  January 19, 2010, MD& M – East    Silicon Cert Laboratories (SCL) will be exhibiting (booth 1776) at the Medical Design & Manufacturing – East Expo and Conference from June 7-10, 2010 at the Jacob K. Javits Convention Center in New York, NY.  This expo and conference, the East Coast’s largest event for medical design and manufacturing, facilitates next-generation medical product development.  Admission for attendees includes additional industry-related shows within the Convention Center such as Atlantic Design & Manufacturing, Automation Technology Expo (ATX) East and Green Manufacturing Expo.

Reading, PA, December 2, 2009, Silicon Cert Laboratories (SCL) has become an affiliate member of ERAI to further its commitment to providing counterfeit detection services to the electronics industry. As a member of ERAI, SCL joins a global organization that monitors, investigates and reports issues that are affecting the electronics industry’s supply chain. ERAI’s mission is to bring together industry best practices for risk mitigation, vendor qualification and order screening to prevent losses and safeguard businesses in an ever-changing and complex environment.

Reading, PA, November 2, 2009, Silicon Cert Laboratories (SCL) will be exhibiting at the Surface Mount Technology Association’s (SMTA) 3rd Annual Symposium on Avoiding, Detecting and Preventing Counterfeit Electronics Parts. The symposium will be held on December 2nd and 3rd at the University of Maryland in College Park. This symposium focuses on the solutions that are available and under development by all sectors on industry to combat the counterfeiting of electronic parts… a threat which impacts the global supply chain. Silicon Cert Laboratories will be highlighting the counterfeit detection services that are offered at our Reading facility.

Reading, PA, October 23, 2009, Silicon Cert Laboratories (SCL) will be exhibiting at the November 17th Philadelphia Expo & Tech Forum being held on at the Radisson Hotel Valley Forge in King of Prussia, PA. This one-day event, sponsored by the Philadelphia SMTA Chapter, will include technical programs on topics such as “preform assembly focus” and “counterfeit electronics components“.

Reading, PA, October 12, 2009, Silicon Cert Laboratories (SCL) will be a GOLD SPONSOR of the 2nd Annual Workshop on MEMS Testing and Reliability being held on October 21st at the Radisson Hotel in San Jose, CA. This one-day event will include workshops on topics such as “Predicting the reliability of Silicon MEMS” and “Developing robust MEMS reliability, test and failure analysis systems”.  

Reading, PA, September 23, 2009, Silicon Cert Laboratories (SCL) will be exhibiting at Texas Instruments’ October 7th Technology Day in Rochester,NY. The one-day seminar and exhibit is “aimed at providing a learning forum where practical high-performance design solutions, tools, techniques, topologies and examples will be presented”.   This event will be held at the RIT Conference Center in West Henrietta, NY.

Reading, PA, September 21, 2009, Silicon Cert Laboratories (SCL) has been accredited by the American Association for Laboratory Accreditation (A2LA) for technical competence in the field of Mechanical Testing.  This accreditation, presented on September 21, 2009, is in accordance with the recognized International Standard ISO/IEC 17025:2005 General Requirements for the Competence of Testing and Calibration Laboratories.  

This accreditation is in addition to Silicon Cert Laboratories’ certification to ISO 9001:2008 by DNV and being listed as a Defense Supply Center, Columbus (DSCC) Commercial Suitable Laboratory for eleven MIL-STD-883 test methods. 

Reading, PA, September 1, 2009, Silicon Cert Laboratories (SCL) has successfully completed being audited by Det Norske Veritas (DNV) to Management System Standard ISO 9001:2008.  The certification is valid for “the manufacture, testing, qualification, certification, failure analysis and repair of electronic and optical components and assemblies. Electron/optical microscopy and analytical services of materials. (Excluding clause 7.3 design)”.

Reading, PA,  August 3, 2009, Silicon Cert Laboratories (SCL) has announced real time X-Ray imaging as its latest in-house analytical services offering.  X-Ray imaging is the nondestructive, internal examination of devices and packages.  Samples ranging from low-density plastic packages to higher-density steel can be viewed with a high degree of detail.
Applications for this technology are wide-ranging in the type of samples that can be examined from a variety of industries.   Within the microelectronics industry, for example, X-Ray imaging serves to detect defects such as wirebond problems, package cracks and voids, and die attach voids.  Real Time X-Ray imaging is often an important technique used in conjunction with other analytical processes.   It is also becoming increasingly important as one of the final steps when performing counterfeit detection.  

Reading, PA December 23, 2008 - Silicon Cert, Ltd. (SCL) will be exhibiting at Electronics New England at the Boston Convention & Exhibition Center in Boston, MA on April 22 -23, 2009. This event is co-located with Assembly/New England, Design & Manufacturing/New England, and Medical Design & Manufacturing. Silicon Cert’s reliability testing and analytical services offerings can be seen at booth 1140. (http://www.nepconeast.com).

Reading, PA July 1, 2008 - Silicon Cert, Ltd. (SCL) will be exhibiting at the 41st International Symposium on Microelectronics as sponsored by the International Microelectronics and Packaging Society (IMAPS). This symposium is being held at the Rhode Island Convention Center in Providence, RI from November 2 through November 6, 2008. Please visit us at booth #724. (http://www.imaps.org/imaps2008)
 

Reading, PA February 26, 2008 - Silicon Cert, Ltd. (SCL) will be exhibiting at the 2008 IEEE MTT-S International Microwave Symposium/Exhibition at the Georgia World Congress Center in Atlanta, GA. The dates of this IEEE-sponsored event are June 17 – 19, 2008. SCL’s testing and analytical services offerings will be on display at booth #322. (http://www.ims2008.org)


Reading, PA January 9, 2008 - Silicon Cert Ltd. (SCL) is pleased to announce having been granted full approval by Delphi Electronics and Safety Component Engineering to perform AEC-Q100 reliability testing per their SQ-1000 Verification and Approval process. This process verifies the technical capability of laboratories to perform specific tests and procedures relative to Delphi requirements.

Reading, PA October 17, 2007 - Silicon Cert Ltd. (SCL) is pleased to announce the offering of Auger Electron Spectroscopy (AES) as an additional analytical service. AES (more commonly known as “auger”) is a surface analysis technique used to identify elements present in the top 50 angstroms of conductive and semiconductive surfaces. It is also a useful tool for contaminant identification as well as for material characterization and failure analysis.

Reading, PA July 12, 2007 - Silicon Cert Ltd. (SCL) is pleased to announce receipt of Commercial Laboratory Suitability Status for ten MIL-STD-883 test methods. As a result of a recent audit by the Defense Logistics Agency, Defense Supply Center, Columbus (DSCC), SCL has received a DSCC-VQ letter of suitability for testing to military specifications . Commercial laboratories that have been issued laboratory suitability are eligible to test the federal stock class type of device called out in a laboratory suitability letter. The ten MIL-STD-883 test methods are listed in Reliability Newsletter No. 22 on our web-site. (http://www.dscc.dla.mil)

Reading, PA July 10, 2007 - Silicon Cert, Ltd. (SCL) will be exhibiting at the 40th International Symposium on Microelectronics as sponsored by the International Microelectronics and Packaging Society (IMAPS). This symposium is being held at the San Jose Convention Center in San Jose, CA from November 12 through November 15, 2007. Please visit us at booth #1224. (http://www.imaps.org)

Reading, PA December 18, 2006 - Silicon Cert, Ltd.
(SCL) will be exhibiting at the 4th Annual Military,  Aerospace, Space, and Homeland Security (MASH) Packaging Issues and Applications topical workshop to be held in Baltimore, MD from May 8 through May 10, 2007. The workshop is being sponsored by the
International Microelectronics & Packaging Society (IMAPS). (http://www.imaps/org/mash/)



Reading, PA October 30, 2006 -  Silicon Cert, Ltd. (SCL) has announced the capability to perform gate leakage testing. Electro-thermally inducted gate leakage is a failure mode induced in high temperature, high electric field environments such as in an engine compartment. SCL’s testing will follow test standard AEC-Q100-006, developed to test the sensitivity of an IC, when performing this test.

Reading, PA July 20, 2006 – Silicon Cert, Ltd. (SCL) will soon be announcing Gate Leakage Testing capability. Watch for further announcements.

Reading, PA June 16, 2006 – Silicon Cert Ltd. (SCL) will be exhibiting at the 39th International Symposium on Microelectronics as sponsored by the International Microelectronics and Packaging Society (IMAPS). The symposium is being held at the San Diego Convention Center, San Diego, CA from October 8 through October 12, 2006. (http://www.imaps.org/imaps2006)



Reading, PA May 30, 2006 – Silicon Cert Ltd. (SCL) will be exhibiting at the Sensors Expo & Conference to be held from June 5 through June 7, 2006 at the Donald E. Stephens Convention Center in Rosemont, IL. Sensors Expo & Conference is the only industry event in North America that focuses exclusively on sensors and sensor-integrated systems. SCL will be located in booth 534. (http://www.sensorsexpo.com)

Reading, PA April 20, 2006 – Silicon Cert Ltd. (SCL) will be attending the 11th Annual Automotive Electronics Council (AEC) Reliability Workshop from May 9-11 in Indianapolis. The workshop is being held at the Sheraton Indianapolis Hotel and Suites. (http://www.aecouncil.com)

Reading, PA April 17, 2006 – Silicon Cert Ltd. (SCL) will be exhibiting at NEPCON East to be held at the Boston Convention & Exhibition Center, Boston, MA from May 10, 2006 to May 11, 2006. The theme of this year’s electronics assembly show is “Build it smaller, faster, better”. (http://www.nepcon.com)

Reading, PA December 1, 2005 – Silicon Cert Ltd. (SCL) has announced the capability to perform fiber integrity testing to GR-468-CORE, Issue 2. Fiber integrity is a series of tests which include 1) twist testing, 2) side pull testing, and 3) cable retention testing, all of which are a requirement for optoelectronic modules and integrated modules with fiber pigtails.

Reading, PA July 18, 2005 - Silicon Cert (SCL) has announced the acquisition of a Random Vibration Testing System. The purchase of the system, expected to be operational by late summer, is in response to clients' inquiries in the need of Random Vibration Testing. This service will complement SCL's existing Sinusoidal Vibration Testing capability.