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In an effort to provide a full-menu of testing services, Silicon Cert Laboratories offers a variety of tests in addition to mechanical integrity and endurance/environmental. Those highlighted below comprise a partial listing of our additional offerings. We are one of the few laboratories that will consider performing one-time, out-of-the-ordinary testing for our clients. If you do not see your test listed on our site, please contact us and we will be glad to discuss it with you.
ESD Threshold
Electrostatic Discharge or ESD is a well-known cause of failure for electronic and electro-optical components. The primary purpose of ESD testing is to determine the threshold level of voltage that will cause failure of a component, or alternately, the “withstand voltage” (the highest voltage that can be applied without causing failure). While various standards provide methods to determine the threshold level, ESD testing is also sometimes used as a “go / no go” test to determine if a component will pass a predetermined stress level.
Silicon Cert Laboratories performs Human Body Model (HBM) and Machine Model (MM) threshold testing.
Leak Detect (Hermeticity)
The purpose of this test is to determine the effective hermeticity of microelectronic and semiconductor devices with designed internal cavities. Silicon Cert Laboratories offers both Fine Leak – helium (he) and Gross Leak – Negative Ion Detection (NID) testing. Gross leak testing normally is to follow fine leak testing.
Hermeticity evaluation testing can also be performed by mounting a miniaturized microelectronic sensor inside the device to monitor real-time moisture ingress as a function of changing external ambient conditions. More information @ T.J. Green Associates, LLC.
Physical Dimensions
The intent of this test/examination is to verify that the external physical dimensions of the device are in accordance with the applicable acquisition document. Dimensions which fall outside the specified tolerances shall be considered failures as it they may affect the handling of or the operation of the packages after its “installation”.
| Other Specialized Optical/Electrical Tests |
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Tests Conducted Through Partnerships |
Insertion Loss
Optical Gain
Bit Error Rates (to 12 Gb/s)
Optical Extinction Ratio
Hi-Speed E/O Rise & Fall times
E/O Power Out
E/O Spectrum Analysis
High Current Surge
Semiconductor Parametric Analysis
Characterization
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Altitude
ESD-CDM
Residual Gas Analysis
Salt Atmosphere |
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