Accelerated bias aging, HTOB, HTOL, and OLT are examples of the names given to tests used in determining the quality or reliability of product. Accelerated bias aging uses elevated temperature to accelerate existing failure mechanisms, thereby simulating years of real-life operation in just hours or days. Regression curves are used to plot the data of failures versus time and temperature. These curves can then be used to extrapolate device performance to the use condition, i.e. temperature. FIT rates (Failures-In-Time, 1e9 device-hours of operation) can be calculated using the results of these aging experiments.

Silicon Cert Laboratories has the capability to process units up to 200°C. Typically this test requires the use of dual power supplies, although this may be expanded if necessary. SCL also has an input capability to age devices dynamically, thus more closely resembling actual use conditions. Our dedicated ovens have internal plug-in sockets, externally mounted application configurable interface cards, real time displays for monitoring each device, elapsed time timers, and chart recorders for temperature, voltage and current monitoring of up to 13 channels. The option of monitoring and storing snapshot data at intervals ranging from minutes to weeks through the use of our data acquisition system is also available to our clients.