Reading, PA July 1, 2008 - Silicon Cert, Ltd. (SCL) will be exhibiting at the 41st International Symposium on Microelectronics as sponsored by the International Microelectronics and Packaging Society (IMAPS). This symposium is being held at the Rhode Island Convention Center in Providence, RI from November 2 through November 6, 2008. Please visit us at booth #724. (http://www.imaps.org/imaps2008)
 

Reading, PA February 26, 2008 - Silicon Cert, Ltd. (SCL) will be exhibiting at the 2008 IEEE MTT-S International Microwave Symposium/Exhibition at the Georgia World Congress Center in Atlanta, GA. The dates of this IEEE-sponsored event are June 17 – 19, 2008. SCL’s testing and analytical services offerings will be on display at booth #322. (http://www.ims2008.org)


Reading, PA January 9, 2008 - Silicon Cert Ltd. (SCL) is pleased to announce having been granted full approval by Delphi Electronics and Safety Component Engineering to perform AEC-Q100 reliability testing per their SQ-1000 Verification and Approval process. This process verifies the technical capability of laboratories to perform specific tests and procedures relative to Delphi requirements.

Reading, PA October 17, 2007 - Silicon Cert Ltd. (SCL) is pleased to announce the offering of Auger Electron Spectroscopy (AES) as an additional analytical service. AES (more commonly known as “auger”) is a surface analysis technique used to identify elements present in the top 50 angstroms of conductive and semiconductive surfaces. It is also a useful tool for contaminant identification as well as for material characterization and failure analysis.

Reading, PA July 12, 2007 - Silicon Cert Ltd. (SCL) is pleased to announce receipt of Commercial Laboratory Suitability Status for ten MIL-STD-883 test methods. As a result of a recent audit by the Defense Logistics Agency, Defense Supply Center, Columbus (DSCC), SCL has received a DSCC-VQ letter of suitability for testing to military specifications . Commercial laboratories that have been issued laboratory suitability are eligible to test the federal stock class type of device called out in a laboratory suitability letter. The ten MIL-STD-883 test methods are listed in Reliability Newsletter No. 22 on our web-site. (http://www.dscc.dla.mil)

Reading, PA July 10, 2007 - Silicon Cert, Ltd. (SCL) will be exhibiting at the 40th International Symposium on Microelectronics as sponsored by the International Microelectronics and Packaging Society (IMAPS). This symposium is being held at the San Jose Convention Center in San Jose, CA from November 12 through November 15, 2007. Please visit us at booth #1224. (http://www.imaps.org)

Reading, PA December 18, 2006 - Silicon Cert, Ltd.
(SCL) will be exhibiting at the 4th Annual Military,  Aerospace, Space, and Homeland Security (MASH) Packaging Issues and Applications topical workshop to be held in Baltimore, MD from May 8 through May 10, 2007. The workshop is being sponsored by the
International Microelectronics & Packaging Society (IMAPS). (http://www.imaps/org/mash/)



Reading, PA October 30, 2006 -  Silicon Cert, Ltd. (SCL) has announced the capability to perform gate leakage testing. Electro-thermally inducted gate leakage is a failure mode induced in high temperature, high electric field environments such as in an engine compartment. SCL’s testing will follow test standard AEC-Q100-006, developed to test the sensitivity of an IC, when performing this test.

Reading, PA July 20, 2006 – Silicon Cert, Ltd. (SCL) will soon be announcing Gate Leakage Testing capability. Watch for further announcements.

Reading, PA June 16, 2006 – Silicon Cert Ltd. (SCL) will be exhibiting at the 39th International Symposium on Microelectronics as sponsored by the International Microelectronics and Packaging Society (IMAPS). The symposium is being held at the San Diego Convention Center, San Diego, CA from October 8 through October 12, 2006. (http://www.imaps.org/imaps2006)



Reading, PA May 30, 2006 – Silicon Cert Ltd. (SCL) will be exhibiting at the Sensors Expo & Conference to be held from June 5 through June 7, 2006 at the Donald E. Stephens Convention Center in Rosemont, IL. Sensors Expo & Conference is the only industry event in North America that focuses exclusively on sensors and sensor-integrated systems. SCL will be located in booth 534. (http://www.sensorsexpo.com)

Reading, PA April 20, 2006 – Silicon Cert Ltd. (SCL) will be attending the 11th Annual Automotive Electronics Council (AEC) Reliability Workshop from May 9-11 in Indianapolis. The workshop is being held at the Sheraton Indianapolis Hotel and Suites. (http://www.aecouncil.com)

Reading, PA April 17, 2006 – Silicon Cert Ltd. (SCL) will be exhibiting at NEPCON East to be held at the Boston Convention & Exhibition Center, Boston, MA from May 10, 2006 to May 11, 2006. The theme of this year’s electronics assembly show is “Build it smaller, faster, better”. (http://www.nepcon.com)

Reading, PA December 1, 2005 – Silicon Cert Ltd. (SCL) has announced the capability to perform fiber integrity testing to GR-468-CORE, Issue 2. Fiber integrity is a series of tests which include 1) twist testing, 2) side pull testing, and 3) cable retention testing, all of which are a requirement for optoelectronic modules and integrated modules with fiber pigtails.

Reading, PA July 18, 2005 - Silicon Cert (SCL) has announced the acquisition of a Random Vibration Testing System. The purchase of the system, expected to be operational by late summer, is in response to clients' inquiries in the need of Random Vibration Testing. This service will complement SCL's existing Sinusoidal Vibration Testing capability.