Particle Impact Noise Detection testing, known as PIND or PIN-D, is performed to detect loose particles inside a device cavity. The test provides a nondestructive means of identifying those devices containing sufficient mass that, upon impact with the case, excite the transducer.

The equipment required for this test includes a threshold detector, a variable shaker and driver assembly to provide a sinusoidal motion to the DUT (device under test), a transducer and a shock mechanism capable of imparting shock pulses to the DUT.

Silicon Cert Laboratories’ scope of work includes conducting PIND testing to both MIL-STD-883, Method 2020 and MIL-STD-202, Method 217.