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Optical Microscopy is a powerful yet often under utilized
tool. The use of visible light to evaluate a sample can provide
valuable information about a sample’s structure and
composition. This technique alone can supply the information
needed to solve the problem or direct the analyst along the
most efficient path to gain additional information.
There are three common types of optical microscopy; brightfield
illumination, darkfield illumination, and Nomarski. Brightfield
illumination is the most commonly used mode. In this mode,
light directly striking the surface is reflected based on
the sample’s composition and topography. With darkfield
illumination the center of the light cone is blocked allowing
only light scattering along the surface at a low angle to
illuminate the field of view. This method is good for viewing
particles, edges, or other changes occurring on a sample’s
surface. The third common type of optical microscopy, Nomarski
imaging, is a form of interference contrast that uses polarized
light passed through a prism to view the sample. Nomarski
imaging is particularly useful for viewing shallow defects
such as etch pits and cracks.
Silicon Cert Laboratories uses optical microscopy to inspect all submitted
samples and will direct our customers along the most efficient
course of analysis. SCL can provide digital images
in a variety of formats from a full range of microscopes, and can provide dimension measurements
using a toolmakers measuring microscope calibrated to a traceable
standard.
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