PARTICLE IMPACT NOISE DETECT
Particle Impact Noise Detect testing, known as PIND or
PIN-D, is performed to detect loose particles inside a
device cavity. The test provides a nondestructive means of
identifying those devices containing sufficient mass that,
upon impact with the case, excite the transducer.
The equipment required for this test includes a threshold
detector, a variable shaker and driver assembly to provide a
sinusoidal motion to the DUT, a transducer, and a shock
mechanism capable of imparting shock pulses to the DUT.
Silicon Cert Laboratories (SCL) has recently received Commercial
Laboratory Suitability Status for MIL-STD-883G, Method
2020.8 PIND testing through the Defense Logistics Agency,
Defense Supply Center, Columbus (DSCC). SCL’s Suitability
Letter for PIND and other MIL-STD-883G tests can be viewed
here.
For more information about PIND testing please call us at
610-939-9500.
Reliability Testing
SCL, as a leading reliability testing company with many
years of experience, can economically perform other
reliability tests, including:
- Mechanical Shock
- Vibration
- Accelerated Bias Aging
- Autoclave
- Temperature Cycling
- Tin Whisker Studies
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- Damp Heat / THB
- Cyclic Moisture
- SAM Analysis
- Thermal Shock
- Fine & Gross Leak Detect
- MSL and Preconditioning
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- Centrifuge
- PIND
- Cross-sectioning
- HAST
- SEM analysis
- IC Decapsulation
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