Accelerated Bias Aging Testing


 Accelerated bias aging deals with determining the reliability (quality) of semiconductor devices.   This includes

                  HTOL        High Temperature Operating Life
                  HTOB        High Temperature Operating Bias
                  HTRB        High Temperature Reverse Bias
                  HTGB        High Temperature Gate Bias
                  OLT           Operating Life Temperature

 Accelerated bias aging testing combines elevated temperature and voltage to accelerate various failure mechanisms in semiconductors.  This process simulates years of real-life operation in just hours or days.  Regression curves can be generated from the data to plot failures versus time and temperature. These curves are used to derive the device FIT rates (Failures-In-Time).   FIT rates are indicators of device reliability and are used to predict device performance at the use-condition, i.e. device operating temperature and voltage stress.  One FIT implies one failure per 1e9 device-hours of operation. 

HTOL testing, known as High Temperature Operating Life, elevates temperature and high voltage to apply stress to an integrated circuit.  It is also referred to as HTOB, HTRB, and HTBG.  This testing is used for qualification purposes and the devices are scrapped.  Generally, burn-in is performed for a shorter period of time and is a certification test for a devices that was previously qualified using HTOL or HTOB.   AAt SCL, a method to determine the reliability and life expectancy of a device is Intermittent Operating Life testing, known as IOL testing.

Silicon Cert Laboratories has accelerated bias aging capability to process devices up to 200°C and up to 1700 Vdc.  Our unique dedicated chambers have internal socketed DUT-boards and externally mounted, application-configurable interface cards with built-in capability for real-time per-device monitoring, and a back-up chart recorder to monitor chamber temperature, power supply voltage(s), etc. as required.

 The monitoring option provides the ability to generate real-time snapshot data and time-series plots of device lot performance at customer-selected time intervals.  Monitoring data can be recorded at intervals as small as partial minutes (small lots) per customer request through the use of our data acquisition system.  Monitored data can be downloaded and delivered in EXCEL format at any time interval per customer request.

 SCL's HTRB testing at 1700 volts has pleased many customers.   Contact the experts at Silicon Cert Laboratories to obtain information on your Accelerated Bias Aging Testing requirements.


Test Specifications / Standards

  • JESD22-A108                                                                                                          AEC-Q101    AEC-Q100                                    
  • MIL-STD-202  Method 108                                                                                      MIL-STD-750 Method 1042         
  • MIL-STD-750  Method 1026                        MIL-STD-883  Method 1005               MIL-STD-883 Method 1005           
  • MIL-STD-750  Method 1038                        MIL-STD-883  Method 1015                
  • MIL-STD-750  Method 1039                        MIL-STD-883  Method  1016
  • MIL-STD-750  Method 1040                        MIL-STD-883  Method 1030
  • MIL-STD-750  Method  1048                        MIL-STD-883  Method 1033