Accelerated Bias Aging Testing

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 Accelerated bias aging deals with determining the reliability (quality) of semiconductor devices.   Other names for this include HTOB (High Temperature Operating Bias), HTOL (High Temperature Operating Life), HTRB (High Temperature Reverse Bias, HTGB (High Temperature Gate BIAS), OLT (Operating Life Temperature), and Burn-in.   Accelerated bias aging testing combines elevated temperature and voltage to accelerate various failure mechanisms in semiconductors.  This process simulates years of real-life operation in just hours or days.  Regression curves can be generated from the data to plot failures versus time and temperature. These curves are used to derive the device FIT rates (Failures-In-Time).   FIT rates are indicators of device reliability and are used to predict device performance at the use-condition, i.e. device operating temperature and voltage stress.  One FIT implies one failure per 1e9 device-hours of operation.

Silicon Cert Laboratories has accelerated bias aging capability to process devices up to 200°C and up to 1700 Vdc.  Our unique dedicated chambers have internal socketed DUT-boards and externally mounted, application-configurable interface cards with built-in capability for real-time per-device monitoring, and a back-up chart recorder to monitor chamber temperature, power supply voltage(s), etc. as required.  The monitoring option provides the ability to generate real-time snapshot data and time-series plots of device lot performance at customer-selected time intervals.  Monitoring data can be recorded at intervals as small as partial minutes (small lots) per customer request through the use of our data acquisition system.  Monitored data can be downloaded and delivered in EXCEL format at any time interval per customer request.  Contact the experts at Silicon Cert Laboratories to obtain information on your Accelerated Bias Aging Testing requirements, especially if you need HTRB testing at 1700 volts.

 

Test Specifications / Standards

  • JESD22-A108
  • MIL-STD-202, Method 108
  • MIL-STD-750, Methods 1026, 1038, 1039, 1040, 1048
  • MIL-STD-883, Methods 1005, 1015, 1016, 1030, 1033