Highly Accelerated Stress Test (HAST)


HAST (Highly Accelerated Stress Test) is a combination of high temperature, high humidity, pressure, and time.   At SCL, our engineering staff provides the option of the HAST test being run with or without electrical bias.  Most importantly, the HAST test is an accelerated stress version of the traditional non-condensing THB (temperature-humidity-bias) test; this results in having the advantage of adding high pressure and higher temperatures (up to around 145°C) to accelerate temperature and moisture induced failures in roughly one-tenth the time required for THB.   Similar to THB at 85°C/85%RH, HAST testing is usually run at 130°C/85%RH, but the conditions can also be varied.  The typical integrated circuit HAST testing requires ranges: temperature from 105°C to 145° and humidity from 65%RH to 100%RH.  The normal length of an IC HAST test run is 96 hours; once completed, tested samples are returned to the customer in moisture-proof bags with time-to-test labels.   Contact the experts at Silicon Cert Laboratories to discuss and determine your needs for standard driven HAST testing.


Test Specifications / Standards