Leak Detection


The purpose of leak detection testing is to determine the effective hermeticity of microelectronic and semiconductor devices with designed internal cavities. Silicon Cert Laboratories offers both fine leak testing [helium (He)] and gross leak testing [negative ion detection or NID testing]. Gross leak testing normally follows fine leak testing.

Hermeticity evaluation testing can also be performed by mounting a miniaturized microelectronic sensor inside the device to monitor real-time moisture ingress as a function of changing external ambient conditions.  For more information on hermeticiy evaluation testing, refer to T.J. Green Associates, LLC.