The purpose of leak detection testing is to determine the effective hermeticity of microelectronic and semiconductor devices with designed internal cavities. Silicon Cert Laboratories offers both fine leak testing [helium (He)] and gross leak testing [negative ion detection or NID testing]. Gross leak testing normally follows fine leak testing.
Hermeticity evaluation testing can also be performed by mounting a miniaturized microelectronic sensor inside the device to monitor real-time moisture ingress as a function of changing external ambient conditions. For more information on hermeticiy evaluation testing, refer to T.J. Green Associates, LLC.