Constant Acceleration Testing


Constant acceleration testing is a centrifugal test performed to simulate constant acceleration effects on microelectronic devices. This centrifuge test is designed to indicate types of mechanical and structural weaknesses not necessarily detected in vibration or mechanical shock testing.  The constant acceleration test is a high-stress test used to determine the mechanical limits of the package and other elements such as the internal metallization and lead system, the attachment of its die or substrate, and the robustness of its wire bonds.  Silicon Cert Laboratories offers constant acceleration to 50,000g.

At lower, non-destructive levels of stress settings the centrifuge testing may also be utilized as a 100% in-line screen to detect and eliminate packages that exhibit lower than nominal mechanical strengths in any of its structural elements. Unless specified otherwise, the required constant acceleration value shall be applied to each of the package’s six orientations. For packages with internal elements mounted with the major plane perpendicular to the Y axis, the Y1 orientation is defined as the one that tends to displace the elements from their mount.  Contact SCL to obtain more information about constant acceleration testing.


Test Specifications / Standards

  • MIL-STD-202 Method 212
  • MIL-STD-750 Method 2006
  • MIL-STD-883 Method 2001
  • AEC-Q100
  • AEC-Q101