Semiconductor Parametric Testing and Characterization

Semiconductor parametric characterization is available at SCL for wide range of passive devices and discrete components testing.  Semiconductor parametric testing includes electrical testing of active devices in non-production quantities.  Parametric testing of integrated circuits includes curve-tracing, value measurements, and parametric testing of most types of discrete components.  Device characterization and semiconductor ATE testing of small-scale integrated circuits can also be developed by our engineering staff.  Contact Silicon Cert Laboratories today to obtain information and to get a non-obligation quote today!