Particle Impact Noise Detection

Particle Impact Noise Detection testing, known as PIND or PIN-D, is performed to detect loose particles inside a device cavity. The test provides a nondestructive means of identifying those devices containing sufficient mass that, upon impact with the case, excite the transducer. 

The equipment required for this test includes a threshold detector, a variable shaker and driver assembly to provide a sinusoidal motion to the DUT, a transducer, and a shock mechanism capable of imparting shock pulses to the DUT. 

Silicon Cert Laboratories (SCL) has received Commercial Laboratory Suitability Status for MIL-STD-883, Method 2020 PIND testing through the Defense Logistics Agency (DLA).